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Title: Measuring crystal orientation from etched surfaces via directional reflectance microscopy
Authors: Wang, Xiaogang
Gao, Shubo
Jain, Ekta
Gaskey, Bernard
Seita, Matteo
Keywords: Engineering::Materials
Issue Date: 2020
Source: Wang, X., Gao, S., Jain, E., Gaskey, B. & Seita, M. (2020). Measuring crystal orientation from etched surfaces via directional reflectance microscopy. Journal of Materials Science, 55(25), 11669-11678.
Project: MOE2017-T2-2-119
Journal: Journal of Materials Science
Abstract: Mapping crystal orientation has always been the domain of diffraction-based techniques. However, these measurements have limited throughput and require specialized equipment. In this work, we demonstrate crystal orientation mapping on chemically etched aluminum samples using a simple and inexpensive optical technique called directional reflectance microscopy (DRM). DRM quantifies surface reflectance as a function of illumination angle. We identify directional reflectance characteristics of grains with (111) out-of-plane orientation and infer their surface topography to calculate their underlying crystal orientation. We confirm the surface topography using atomic force microscopy and validate DRM orientation measurements with electron backscatter diffraction.
ISSN: 0022-2461
DOI: 10.1007/s10853-020-04734-z
Rights: © 2020 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:ASE Journal Articles
MAE Journal Articles
MSE Journal Articles

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