Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/154059
Title: Effects of LaNiO₃ seed layer on the microstructure and electrical properties of ferroelectric BZT/PZT/BZT thin films
Authors: Ruan, Jinyu
Yin, Chao
Zhang, Tiandong
Pan, Hao
Keywords: Science::Physics
Science::Mathematics
Issue Date: 2021
Source: Ruan, J., Yin, C., Zhang, T. & Pan, H. (2021). Effects of LaNiO₃ seed layer on the microstructure and electrical properties of ferroelectric BZT/PZT/BZT thin films. Frontiers in Materials, 8, 732186-. https://dx.doi.org/10.3389/fmats.2021.732186
Journal: Frontiers in Materials
Abstract: Ferroelectric multilayer films attract great attention for a wide variation of applications. The synergistic effect by combining different functional layers induces distinctive electrical properties. In this study, ferroelectric BaZr0.2Ti0.8O3/PbZr0.52Ti0.48O3/BaZr0.2Ti0.8O3 (BZT/PZT/BZT) multilayer thin films are designed and fabricated by using the magnetron sputtering method, and a LaNiO3 (LNO) seed layer is introduced. The microstructures and electrical properties of the BZT/PZT/BZT films with and without the LNO seed layer are systematically studied. The results show that the BZT/PZT/BZT/LNO thin film exhibits much lower surface roughness and a preferred (100)-orientation growth, with the growth template and tensile stress provided by the LNO layer. Moreover, an enhanced dielectric constant, decreased dielectric loss, and improved ferroelectric properties are achieved in BZT/PZT/BZT/LNO thin films. This work reveals that the seed layer can play an important role in improving the microstructure and properties of ferroelectric multilayer films.
URI: https://hdl.handle.net/10356/154059
ISSN: 2296-8016
DOI: 10.3389/fmats.2021.732186
Schools: School of Physical and Mathematical Sciences 
Rights: © 2021 Ruan, Yin, Zhang and Pan. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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