Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/154470
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dc.contributor.authorLim, Justin Hiap Junen_US
dc.date.accessioned2021-12-27T13:05:18Z-
dc.date.available2021-12-27T13:05:18Z-
dc.date.issued2021-
dc.identifier.citationLim, J. H. J. (2021). Scanning electron microscopy (SEM) of aluminium & magnesium. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/154470en_US
dc.identifier.urihttps://hdl.handle.net/10356/154470-
dc.description.abstractAluminium and magnesium alloys have become increasingly popular for use in various engineering applications such as in the automotive and aerospace industries due to their relatively lower densities, strength, stiffness and relatively lower costs. Hence it is important to determine and understand the causes of failure in these alloys. The aim of this project is to prepare Aluminium 6061-T6 alloy and Magnesium-Aluminium alloy that have been loaded to failure using metallographic processes to reveal their microstructure. The microstructure of a material has a strong influence on its mechanical properties, which in turn determines its usefulness in engineering applications [1]. Examination and analysis of the microstructure using the Optical Microscope and Scanning Electron Microscopy will be conducted, the results of which will be compared with reliable sources to validate the results, and in doing so, show the usefulness of Scanning Electron Microscopy in failure analysis.en_US
dc.language.isoenen_US
dc.publisherNanyang Technological Universityen_US
dc.subjectEngineering::Mechanical engineeringen_US
dc.titleScanning electron microscopy (SEM) of aluminium & magnesiumen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorShu Dong Weien_US
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.description.degreeBachelor of Engineering (Mechanical Engineering)en_US
dc.contributor.supervisoremailMDSHU@ntu.edu.sgen_US
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Appears in Collections:MAE Student Reports (FYP/IA/PA/PI)
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