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Title: Controlled fragmentation of single-atom-thick polycrystalline graphene
Authors: Chen, Ming
Wang, Zhixun
Ge, Xin
Wang, Zhe
Fujisawa, Kazunori
Xia, Juan
Zeng, Qingsheng
Li, Kaiwei
Zhang, Ting
Zhang, Qichong
Chen, Mengxiao
Zhang, Nan
Wu, Tingting
Ma, Shaoyang
Gu, Guoqiang
Shen, Zexiang
Liu, Linbo
Liu, Zheng
Terrones, Mauricio
Wei, Lei
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2020
Source: Chen, M., Wang, Z., Ge, X., Wang, Z., Fujisawa, K., Xia, J., Zeng, Q., Li, K., Zhang, T., Zhang, Q., Chen, M., Zhang, N., Wu, T., Ma, S., Gu, G., Shen, Z., Liu, L., Liu, Z., Terrones, M. & Wei, L. (2020). Controlled fragmentation of single-atom-thick polycrystalline graphene. Matter, 2(3), 666-679.
Project: MOE2015-T2-2-010
MOE 2019-T1-001-103
MOE2019-T1-001- 111
Journal: Matter
Abstract: Controlling the fragmentation of atomically thin and brittle materials is of critical importance for both fundamental interest and technical purposes in fracture mechanics. However, the fragmentation of graphene is often random and uncontrollable because of the presence of grain boundaries and numerous defects. Here, by harnessing the strong localized strain during the necking process of thermoplastic polymers, we introduce a simple yet controllable method to tear apart a monolayer polycrystalline graphene (MPG) sheet into ordered graphene ribbons. More importantly, we show that the presence of active edges helps the graphene ribbons in exhibiting a field-effect characteristic pH response and improves the introduction of dopants. Furthermore, we demonstrate an optically transparent (∼98%), ultrathin (∼70 ± 15 nm), and skin-conformal pressure sensor for real-time tactile sensing. We believe that our results lead to further understanding of the fracture mechanics of graphene and offer unique advantages for practical applications, such as flexible electronics, chemical sensing, and biosensing.
ISSN: 2590-2385
DOI: 10.1016/j.matt.2019.11.004
Rights: © 2019 Elsevier Inc. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles
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