Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/154697
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dc.contributor.authorHu, Haoen_US
dc.contributor.authorLin, Xiaoen_US
dc.contributor.authorWong, Liang Jieen_US
dc.contributor.authorYang, Qianruen_US
dc.contributor.authorLiu, Dongjueen_US
dc.contributor.authorZhang, Baileen_US
dc.contributor.authorLuo, Yuen_US
dc.date.accessioned2022-01-05T02:39:37Z-
dc.date.available2022-01-05T02:39:37Z-
dc.date.issued2022-
dc.identifier.citationHu, H., Lin, X., Wong, L. J., Yang, Q., Liu, D., Zhang, B. & Luo, Y. (2022). Surface Dyakonov–Cherenkov radiation. ELight, 2, 2-. https://dx.doi.org/10.1186/s43593-021-00009-5en_US
dc.identifier.issn2662-8643en_US
dc.identifier.urihttps://hdl.handle.net/10356/154697-
dc.description.abstractRecent advances in engineered material technologies (e.g., photonic crystals, metamaterials, plasmonics, etc) provide valuable tools to control Cherenkov radiation. In all these approaches, however, the particle velocity is a key parameter to affect Cherenkov radiation in the designed material, while the influence of the particle trajectory is generally negligible. Here, we report on surface Dyakonov-Cherenkov radiation, i.e. the emission of directional Dyakonov surface waves from a swift charged particle moving atop a birefringent crystal. This new type of Cherenkov radiation is highly susceptible to both the particle velocity and trajectory, e.g. we observe a sharp radiation enhancement when the particle trajectory falls in the vicinity of a particular direction. Moreover, close to the Cherenkov threshold, such a radiation enhancement can be orders of magnitude higher than that obtained in traditional Cherenkov detectors. These distinct properties allow us to determine simultaneously the magnitude and direction of particle velocities on a compact platform. The surface Dyakonov-Cherenkov radiation studied in this work not only adds a new degree of freedom for particle identification, but also provides an all-dielectric route to construct compact Cherenkov detectors with enhanced sensitivity.en_US
dc.description.sponsorshipAgency for Science, Technology and Research (A*STAR)en_US
dc.description.sponsorshipMinistry of Education (MOE)en_US
dc.description.sponsorshipNational Research Foundation (NRF)en_US
dc.language.isoenen_US
dc.relationMOE2018- T2-2-189 (S)en_US
dc.relationMOE2017-T1-001-239 (RG91/17 (S))en_US
dc.relationA18A7b0058en_US
dc.relationNRF-CRP18-2017-02en_US
dc.relationMOE2018‐T2‐1‐022 (S)en_US
dc.relationMOE2016‐T3‐1‐006en_US
dc.relationRG174/16 (S)en_US
dc.relationA1984c0043en_US
dc.relation.ispartofeLighten_US
dc.relation.uri10.21979/N9/IYSBVRen_US
dc.rights© 2022 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.en_US
dc.subjectEngineering::Electrical and electronic engineeringen_US
dc.titleSurface Dyakonov–Cherenkov radiationen_US
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.contributor.schoolSchool of Physical and Mathematical Sciencesen_US
dc.identifier.doi10.1186/s43593-021-00009-5-
dc.description.versionPublished versionen_US
dc.identifier.volume2en_US
dc.identifier.spage2en_US
dc.subject.keywordsCherenkov Radiationen_US
dc.subject.keywordsDyakonov Surface Waveen_US
dc.description.acknowledgementY.L. was sponsored in part by Singapore Ministry of Education (No. MOE2018- T2-2-189 (S), MOE2017-T1-001-239 (RG91/17 (S)), A*Star AME Programmatic Funds (No. A18A7b0058) and National Research Foundation Singapore Competitive Research Program (No. NRF-CRP18-2017-02). B.Z. was sponsored in part by Singapore Ministry of Education (No. MOE2018‐T2‐1‐022 (S), MOE2016‐T3‐1‐006 and Tier 1 RG174/16 (S)). L.J.W. was sponsored in part by the Advanced Manufacturing and Engineering Young Individual Research Grant (No. A1984c0043) from the Science and Engineering Research Council of the Agency for Science, Technology and Research, Singapore. X. L. was sponsored in part by the National Natural Science Foundation of China (NSFC) (No. 62175212), the Fundamental Research Funds for the Central Universities (No. 2021FZZX001-19), and Zhejiang University Global Partnership Fund.en_US
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