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Title: Surface Dyakonov–Cherenkov radiation
Authors: Hu, Hao
Lin, Xiao
Wong, Liang Jie
Yang, Qianru
Liu, Dongjue
Zhang, Baile
Luo, Yu
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2022
Source: Hu, H., Lin, X., Wong, L. J., Yang, Q., Liu, D., Zhang, B. & Luo, Y. (2022). Surface Dyakonov–Cherenkov radiation. ELight, 2, 2-.
Project: MOE2018- T2-2-189 (S)
MOE2017-T1-001-239 (RG91/17 (S))
MOE2018‐T2‐1‐022 (S)
RG174/16 (S)
Journal: eLight
Abstract: Recent advances in engineered material technologies (e.g., photonic crystals, metamaterials, plasmonics, etc) provide valuable tools to control Cherenkov radiation. In all these approaches, however, the particle velocity is a key parameter to affect Cherenkov radiation in the designed material, while the influence of the particle trajectory is generally negligible. Here, we report on surface Dyakonov-Cherenkov radiation, i.e. the emission of directional Dyakonov surface waves from a swift charged particle moving atop a birefringent crystal. This new type of Cherenkov radiation is highly susceptible to both the particle velocity and trajectory, e.g. we observe a sharp radiation enhancement when the particle trajectory falls in the vicinity of a particular direction. Moreover, close to the Cherenkov threshold, such a radiation enhancement can be orders of magnitude higher than that obtained in traditional Cherenkov detectors. These distinct properties allow us to determine simultaneously the magnitude and direction of particle velocities on a compact platform. The surface Dyakonov-Cherenkov radiation studied in this work not only adds a new degree of freedom for particle identification, but also provides an all-dielectric route to construct compact Cherenkov detectors with enhanced sensitivity.
ISSN: 2662-8643
DOI: 10.1186/s43593-021-00009-5
DOI (Related Dataset): 10.21979/N9/IYSBVR
Rights: © 2022 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
SPMS Journal Articles

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