Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/154949
Title: Enhanced photon emission from free electron excitation of a nanowell
Authors: Nussupbekov, Ayan
Adamo, Giorgio
So, Jin-Kyu
Wu, Lin
Chong, Yidong
Wong, Liang Jie
Keywords: Science::Physics::Optics and light
Issue Date: 2021
Source: Nussupbekov, A., Adamo, G., So, J., Wu, L., Chong, Y. & Wong, L. J. (2021). Enhanced photon emission from free electron excitation of a nanowell. APL Photonics, 6(9), 096101-. https://dx.doi.org/10.1063/5.0054456
Project: A1984c0043 
MOE2016-T3-1-006 
RG148/20 
MOE2019-T2-2-085 
RG187/18 
Journal: APL Photonics 
Abstract: Efficient nanoscale light sources are sought after for applications such as sensing, imaging, and the development of photonic circuits. In particular, free electron light sources have gained much attention due to their ability to tune and direct light emission. Here, we show that radiation from free electrons passing through a 100 nm wide nanohole can reach as high as 90% of the theoretical limit. This is accomplished through the introduction of a circular nanoridge around the hole to form a structure we call the nanowell. The power radiated from the nanowell exceeds that of a regular nanohole by over 100 times and that of nanoholes surrounded by other features, such as bullseyes, by similar enhancement factors. Upon varying the structural parameters of the nanowell, the peak output wavelength can be tuned over a broad frequency range from the visible to the near-infrared. This reveals a route to extracting power from free electrons via material nanopatterning.
URI: https://hdl.handle.net/10356/154949
ISSN: 2378-0967
DOI: 10.1063/5.0054456
Schools: School of Physical and Mathematical Sciences 
School of Electrical and Electronic Engineering 
Organisations: Institute of High Perfomance Computing, A*STAR
Research Centres: Centre for Disruptive Photonic Technologies (CDPT) 
Rights: © 2021 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). https://doi.org/10.1063/5.0054456.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
SPMS Journal Articles

Files in This Item:
File Description SizeFormat 
5.0054456_removed.pdf5.18 MBAdobe PDFThumbnail
View/Open

SCOPUSTM   
Citations 50

3
Updated on May 28, 2023

Web of ScienceTM
Citations 50

3
Updated on May 24, 2023

Page view(s)

53
Updated on Jun 2, 2023

Download(s)

7
Updated on Jun 2, 2023

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.