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|Title:||Cascaded multioutput multilevel converter: modulation and operating limits||Authors:||Ahmed S. Hussein
Amer Mohammad Yusuf Mohammad Ghias
|Keywords:||Engineering::Electrical and electronic engineering::Power electronics||Issue Date:||2021||Source:||Ahmed S. Hussein & Amer Mohammad Yusuf Mohammad Ghias (2021). Cascaded multioutput multilevel converter: modulation and operating limits. IEEE Transactions On Industrial Electronics, 69(1), 399-408. https://dx.doi.org/10.1109/TIE.2021.3050374||Project:||2018-T1-002-109 (RG171/18)||Journal:||IEEE Transactions on Industrial Electronics||Abstract:||This article presents the modulation and operating limits of the modified cascaded multioutput multilevel converter. A phase-disposition pulsewidth modulation strategy is developed to apply the optimal state that leads to a minimized device switching. A Hamming distance-based cost function is adopted to evaluate the number of device transitions. The cost function is further modified to identify the optimal state from a number of feasible states. Moreover, the operating limits of the converter are analyzed for the safe and valid operation of the converter. Simulation and experiment results validate the theoretical analysis, and the converter is operational under a wide range of operation points. The proposed optimal state modulation strategy is shown to be effective in reducing the average device switching frequency.||URI:||https://hdl.handle.net/10356/156684||ISSN:||0278-0046||DOI:||10.1109/TIE.2021.3050374||Rights:||© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TIE.2021.3050374.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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