Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/156980
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dc.contributor.authorAggarwal, Saumayen_US
dc.date.accessioned2022-05-05T07:09:00Z-
dc.date.available2022-05-05T07:09:00Z-
dc.date.issued2022-
dc.identifier.citationAggarwal, S. (2022). Optimization of low-noise rapid data collection in TMDC semiconductor devices. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/156980en_US
dc.identifier.urihttps://hdl.handle.net/10356/156980-
dc.description.abstractThe impending stagnation of scalability in silicon semiconductor transistor industry has led researchers to explore two-dimensional transition metal dichalcogenides (TMDCs). TMDCs can be exfoliated into a few atom-thick layers with unique electrical and optical properties. TMDCs have applications in nano-electronical and optoelectrical devices such as biosensors, field effect transistors (FETs), photodiodes, nano-wearable technology, and transparent flexible displays. There is still a large research potential of these materials to investigate their properties and new physics such as spintronics and valleytronics, hence there is a need to speed up and optimize the data collection for experimentation on such devices. To this end, we compare a specialist, self-contained electrical transport measurement instrument (Nanonis Tramea TM) to a traditional setup consisting of separate lock-ins, voltage sources, and amplifiers integrated together with LabView. The trade-off between their data collection time and noise level is compared, while verifying electrical transport properties of a MoS2 based FET device. The study found the Nanonis Tramea system to be almost 100 times faster than a traditional lock-in setup with LabView, while maintaining a higher signal to noise ratio. This could potential cut down experimentation times from weeks to days. The peak mobility of the tri-layer MoS2 FET at room temperature is found to be 4.7 cm2 V-1 s-1, with an on/off ratio of 500:1.en_US
dc.language.isoenen_US
dc.publisherNanyang Technological Universityen_US
dc.subjectScience::Physicsen_US
dc.titleOptimization of low-noise rapid data collection in TMDC semiconductor devicesen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorBent Weberen_US
dc.contributor.schoolSchool of Physical and Mathematical Sciencesen_US
dc.description.degreeBachelor of Science in Applied Physicsen_US
dc.contributor.supervisoremailb.weber@ntu.edu.sgen_US
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Appears in Collections:SPMS Student Reports (FYP/IA/PA/PI)
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