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Title: EEG-based stress recognition using deep learning techniques
Authors: Syabil Kwajah
Keywords: Engineering::Computer science and engineering::Computing methodologies::Simulation and modeling
Engineering::Electrical and electronic engineering::Computer hardware, software and systems
Issue Date: 2022
Publisher: Nanyang Technological University
Source: Syabil Kwajah (2022). EEG-based stress recognition using deep learning techniques. Final Year Project (FYP), Nanyang Technological University, Singapore.
Abstract: Stress recognition using Electroencephalogram (EEG) based signal is a promising area of study. There had been multiple studies about stress recognition however, the aim of this project was to implement Deep Learning for stress detection. As EEG is the least intrusive data collecting method and experiment can be conducted in a controlled environment, more studies are discovering the potential EEG has. Being a relatively new field, Deep Learning has a broad spectrum of possibilities to be explored to improve the efficiency as well as accuracy for stress detection. An optimum algorithm has yet to be identified for Stress Recognition with Deep Learning Techniques. The aim of this paper is to implement a well-known Neural Network called Convolutional Neural Network (CNN) along with Recurrent Neural Network (RNN) called R-CNN. CNN handling spatial information and the RNN handling temporal information. The RNN used will be the LSTM architecture. Statistical Features will be extracted during the feature extraction portion before moving on to the deep learning techniques. As a baseline comparison, a paper with similar parameters was used with a different classifier. The accuracy obtained from the paper was 67.08% using K-Nearest Neighbour (KNN) with 2 classes. Dataset used from both paper is from a Dataset for Emotion Analysis using EEG, Physiological and video signals (DEAP). With the completion of this paper, hopefully more insights and research will be done within the ever-growing field.
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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