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https://hdl.handle.net/10356/157429
Title: | Deep learning for anomaly detection | Authors: | Tan, Kenneth Jun Wei | Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2022 | Publisher: | Nanyang Technological University | Source: | Tan, K. J. W. (2022). Deep learning for anomaly detection. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/157429 | Project: | A1144-211 | Abstract: | Anomaly detection methods are devoted to target detection schemes in which no priori information about the spectra of the targets of interest is available. This paper research on the 4 various types of anomaly detection machine learning anomaly models, namely Local Outlier Factor (LOF), Isolation Forest, One-Class Support Vector Machine (SVM), and Robust Covariance. Additionally, this paper shows the various steps in the implementation anomaly models and studies the effectiveness of each model in analysing an industrialized Multivariate Time-Series dataset. | URI: | https://hdl.handle.net/10356/157429 | Schools: | School of Electrical and Electronic Engineering | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
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File | Description | Size | Format | |
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Tan Jun Wei Kenneth U1922012B FYP Final Report (A1144-211).pdf Restricted Access | 1.02 MB | Adobe PDF | View/Open |
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