Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/157539
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dc.contributor.authorWang, Xueen_US
dc.date.accessioned2022-05-19T08:08:50Z-
dc.date.available2022-05-19T08:08:50Z-
dc.date.issued2022-
dc.identifier.citationWang, X. (2022). Semantic segmentation of delayered IC images with shape-variant convolution. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/157539en_US
dc.identifier.urihttps://hdl.handle.net/10356/157539-
dc.description.abstractSemantic segmentation of delayered IC images pertains to the pixel-wise classification of various circuit components in microscopic IC images. It is commonly achieved by training deep convolutional neural networks (CNN) in an end-to-end manner, such as U-net and FCNs. The receptive field of the convolutional layer in the existing models is mostly invariant shape (commonly square receptive field). In the delayered IC images, the circuit components are however in different shapes/scales and could span a very wide region of the image. The context information thus may not be well-captured by the square receptive field, leading to degraded performance of segmentation. This project aims to apply shape-variant convolution, whose receptive field is related to semantic correlations, to semantic segmentation of delayered IC images for higher accuracy.en_US
dc.language.isoenen_US
dc.publisherNanyang Technological Universityen_US
dc.relationP2026-202en_US
dc.subjectEngineering::Computer science and engineering::Computing methodologies::Image processing and computer visionen_US
dc.subjectEngineering::Computer science and engineering::Computing methodologies::Artificial intelligenceen_US
dc.titleSemantic segmentation of delayered IC images with shape-variant convolutionen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorGwee Bah Hweeen_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.description.degreeBachelor of Engineering (Electrical and Electronic Engineering)en_US
dc.contributor.supervisoremailebhgwee@ntu.edu.sgen_US
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Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)
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