Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/158132
Title: Deep learning and image processing algorithms for tree defect detection
Authors: Tan, Jun Zuo
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2022
Publisher: Nanyang Technological University
Source: Tan, J. Z. (2022). Deep learning and image processing algorithms for tree defect detection. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/158132
Project: B3004-211
Abstract: This paper is the final report for the final year project titled ‘Deep Learning and Image Processing Algorithms for Tree Defect Detection’. The main purpose of this report is to document all the experiments that was conducted throughout the whole project progress. The results that were obtained will also be documented down in this report. This report is 33 pages long excluding the cover page, abstract, content page, reference, and appendix. The main aim of this project is to produce an algorithm that will speed up the detection of defective trees, so as to minimize the possible casualties from trees falling.
URI: https://hdl.handle.net/10356/158132
Schools: School of Electrical and Electronic Engineering 
Organisations: NParks
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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