Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/158132
Title: | Deep learning and image processing algorithms for tree defect detection | Authors: | Tan, Jun Zuo | Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2022 | Publisher: | Nanyang Technological University | Source: | Tan, J. Z. (2022). Deep learning and image processing algorithms for tree defect detection. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/158132 | Project: | B3004-211 | Abstract: | This paper is the final report for the final year project titled ‘Deep Learning and Image Processing Algorithms for Tree Defect Detection’. The main purpose of this report is to document all the experiments that was conducted throughout the whole project progress. The results that were obtained will also be documented down in this report. This report is 33 pages long excluding the cover page, abstract, content page, reference, and appendix. The main aim of this project is to produce an algorithm that will speed up the detection of defective trees, so as to minimize the possible casualties from trees falling. | URI: | https://hdl.handle.net/10356/158132 | Schools: | School of Electrical and Electronic Engineering | Organisations: | NParks | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
Files in This Item:
File | Description | Size | Format | |
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FYP_Final_Report_Tan_Jun_Zuo.pdf Restricted Access | Final Year Report - Deep Learning and Image Processing Algorithms for Tree Defect Detection | 3.35 MB | Adobe PDF | View/Open |
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