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Title: Influence of residual stress distribution and microstructural characteristics on fatigue failure mechanism in Ni-based Superalloy
Authors: Kumar, Dharmesh
Idapalapati, Sridhar
Wang, Wei
Keywords: Engineering::Mechanical engineering
Issue Date: 2021
Source: Kumar, D., Idapalapati, S. & Wang, W. (2021). Influence of residual stress distribution and microstructural characteristics on fatigue failure mechanism in Ni-based Superalloy. Fatigue and Fracture of Engineering Materials and Structures, 44(6), 1583-1601.
Journal: Fatigue and Fracture of Engineering Materials and Structures
Abstract: The influence of residual compressive stress (RCS) depth and magnitude generated through surface treatments such as shot peening (SP), deep cold rolling (DCR), and vibro-peening (VP) on fatigue crack mechanisms of Ni-based superalloy is investigated. The fatigue performance with associated failure mechanisms is measured under strain-controlled fatigue testing upto 104 cycles with total strain in the range of 0.9%–1.4% at an R ratio of 0.1 and 400°C followed by load controlled fatigue until failure. In-depth understanding of the failure mechanism is obtained through fractography analysis, cyclic stress–strain plot, and microstructural features. A pronounced improvement in fatigue life tested at low strain range (0.9%–1.1%) is achieved after inducing RCS up to 400 μm depth. However, the fatigue life is reduced when RCS increased to 800–1000 μm depth. Failure is primarily driven by micro-cracks formed due to balancing tensile stresses and high intensity stress concentration generated as the result of dislocation pile-ups and slip bands. Results are discussed in detail through the evidence of grain refinement, addition of low angle grain boundaries (LAGBs), strain accumulation, and intragranular deformation in the sub-surface.
ISSN: 8756-758X
DOI: 10.1111/ffe.13454
Schools: School of Mechanical and Aerospace Engineering 
Organisations: Advanced Remanufacturing andTechnology Centre, A*STAR
Singapore Institute of ManufacturingTechnology, A*STAR
Rights: © 2021 John Wiley & Sons, Ltd. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
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