Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/160228
Title: | An injection-locked wireless power transfer transmitter with automatic maximum efficiency tracking | Authors: | Feng, Guangyin Sit, Ji-Jon |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2020 | Source: | Feng, G. & Sit, J. (2020). An injection-locked wireless power transfer transmitter with automatic maximum efficiency tracking. IEEE Transactions On Industrial Electronics, 68(7), 5733-5743. https://dx.doi.org/10.1109/TIE.2020.3000102 | Project: | 2018- T1-001-120 (RG 86/18) M4082082.040 |
Journal: | IEEE Transactions on Industrial Electronics | Abstract: | This article presents a closed-loop transmitter for wireless power transfer with automatic resonance frequency tracking to maintain high power transfer efficiency in the over-coupled region. The transmitter consists of a source oscillator, power amplifier (PA), PA driver, matching network, and feedback circuitry. By injecting the resonant output of coupled antenna coils into a source oscillator to form a positive feedback loop, the source oscillator is injection-locked and the closed-loop transmitter functions as a power oscillator with the oscillation frequency determined by the resonance of the coupled coils. The proposed resonant frequency tracking minimizes the change in the input impedance presented to the PA, and hence mitigates mismatch that causes a sharp drop in the PA efficiency of conventional transmitters. Implemented in 0.13 μm Bipolar-CMOS-DMOS (BCD) technology, the prototype maintains PA efficiency above 60% even at highly over-coupled spacings (10 mm), which is significantly below the critical coupling spacing (40 mm). Compared to a transmitter without feedback (i.e., running in open loop), the transfer efficiency at a coupling distance of 10 mm is improved by 6.6 times and the charging range with power transfer efficiency over 50% is also doubled. | URI: | https://hdl.handle.net/10356/160228 | ISSN: | 0278-0046 | DOI: | 10.1109/TIE.2020.3000102 | Schools: | School of Electrical and Electronic Engineering | Research Centres: | Centre for Integrated Circuits and Systems | Rights: | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TIE.2020.3000102. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
20-TIE-0137.R2_Proof_hi1.pdf | 1.74 MB | Adobe PDF | ![]() View/Open |
SCOPUSTM
Citations
50
7
Updated on Sep 24, 2023
Web of ScienceTM
Citations
50
6
Updated on Sep 23, 2023
Page view(s)
60
Updated on Sep 30, 2023
Download(s) 50
43
Updated on Sep 30, 2023
Google ScholarTM
Check
Altmetric
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.