Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/160245
Title: Ultrasensitive photodetectors promoted by interfacial charge transfer from layered perovskites to chemical vapor deposition-grown MoS₂
Authors: Wen, Wen
Zhang, Wenbin
Wang, Xiaojian
Feng, Qingliang
Liu, Zheng
Yu, Ting
Keywords: Engineering::Materials
Issue Date: 2021
Source: Wen, W., Zhang, W., Wang, X., Feng, Q., Liu, Z. & Yu, T. (2021). Ultrasensitive photodetectors promoted by interfacial charge transfer from layered perovskites to chemical vapor deposition-grown MoS₂. Small, 17(36), 2102461-. https://dx.doi.org/10.1002/smll.202102461
Project: MOE2018-T2-2-072
RG93/19
NRF-CRP-21-2018-0007
Journal: Small
Abstract: Heterostructures for charge-carrier manipulation have laid the foundation of modern optoelectronic devices, such as photovoltaics and photodetectors. High-performance heterostructure devices usually impose stringent requirements on the material quality to sustain efficient carrier transport and charge transfer, thus leading to sophisticated fabrication processes. Here, a simple yet efficient strategy is proposed to develop ultrasensitive photodetectors based on heterostructures of chemical vapor deposition-grown MoS2 and polycrystalline-layered perovskites. The layered perovskites possess pure crystallographic orientation with conductive edges in contact with MoS2 , which gives rise to efficient light absorption, exciton diffusion, and interfacial charge transfer. In dark state, the mismatch of work functions of two materials facilitates low dark currents by the depletion of electrons in MoS2 . Under light irradiation, efficient exciton diffusion and interfacial charge transfer are realized in the heterostructures with type-II band alignment, which produces drifting electrons in MoS2 and leaves trapped holes in layered perovskites. The photodetectors present suppress noises and boost photocurrents, yielding a champion device with a responsivity of 2.5 × 104  A W-1 , and a specific detectivity of 4.1 × 1014  Jones. The results demonstrate a scalable approach for the integration of high-performance devices with high tolerance to defects.
URI: https://hdl.handle.net/10356/160245
ISSN: 1613-6810
DOI: 10.1002/smll.202102461
Schools: School of Physical and Mathematical Sciences 
School of Materials Science and Engineering 
Rights: © 2021 Wiley-VCH GmbH. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles
SPMS Journal Articles

SCOPUSTM   
Citations 20

13
Updated on Sep 23, 2023

Web of ScienceTM
Citations 20

13
Updated on Sep 26, 2023

Page view(s)

270
Updated on Sep 30, 2023

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.