Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/160516
Title: Texture memory-augmented deep patch-based image inpainting
Authors: Xu, Rui
Guo, Minghao
Wang, Jiaqi
Li, Xiaoxiao
Zhou, Bolei
Loy, Chen Change
Keywords: Engineering::Computer science and engineering
Issue Date: 2021
Source: Xu, R., Guo, M., Wang, J., Li, X., Zhou, B. & Loy, C. C. (2021). Texture memory-augmented deep patch-based image inpainting. IEEE Transactions On Image Processing, 30, 9112-9124. https://dx.doi.org/10.1109/TIP.2021.3122930
Journal: IEEE Transactions on Image Processing 
Abstract: Patch-based methods and deep networks have been employed to tackle image inpainting problem, with their own strengths and weaknesses. Patch-based methods are capable of restoring a missing region with high-quality texture through searching nearest neighbor patches from the unmasked regions. However, these methods bring problematic contents when recovering large missing regions. Deep networks, on the other hand, show promising results in completing large regions. Nonetheless, the results often lack faithful and sharp details that resemble the surrounding area. By bringing together the best of both paradigms, we propose a new deep inpainting framework where texture generation is guided by a texture memory of patch samples extracted from unmasked regions. The framework has a novel design that allows texture memory retrieval to be trained end-to-end with the deep inpainting network. In addition, we introduce a patch distribution loss to encourage high-quality patch synthesis. The proposed method shows superior performance both qualitatively and quantitatively on three challenging image benchmarks, i.e., Places, CelebA-HQ, and Paris Street-View datasets (Code will be made publicly available in https://github.com/open-mmlab/mmediting).
URI: https://hdl.handle.net/10356/160516
ISSN: 1057-7149
DOI: 10.1109/TIP.2021.3122930
Schools: School of Computer Science and Engineering 
Rights: © 2021 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:SCSE Journal Articles

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