Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/160593
Title: The curse of class imbalance and conflicting metrics with machine learning for side-channel evaluations
Authors: Picek, Stjepan
Heuser, Annelie
Jovic, Alan
Bhasin, Shivam
Regazzoni, Francesco
Keywords: Engineering::Computer science and engineering
Issue Date: 2019
Source: Picek, S., Heuser, A., Jovic, A., Bhasin, S. & Regazzoni, F. (2019). The curse of class imbalance and conflicting metrics with machine learning for side-channel evaluations. IACR Transactions On Cryptographic Hardware and Embedded Systems, 2019(1), 209-237. https://dx.doi.org/10.13154/tches.v2019.i1.209-237
Journal: IACR Transactions on Cryptographic Hardware and Embedded Systems 
Abstract: We concentrate on machine learning techniques used for profiled side-channel analysis in the presence of imbalanced data. Such scenarios are realistic and often occurring, for instance in the Hamming weight or Hamming distance leakage models. In order to deal with the imbalanced data, we use various balancing techniques and we show that most of them help in mounting successful attacks when the data is highly imbalanced. Especially, the results with the SMOTE technique are encouraging, since we observe some scenarios where it reduces the number of necessary measurements more than 8 times. Next, we provide extensive results on comparison of machine learning and side-channel metrics, where we show that machine learning metrics (and especially accuracy as the most often used one) can be extremely deceptive. This finding opens a need to revisit the previous works and their results in order to properly assess the performance of machine learning in side-channel analysis.
URI: https://hdl.handle.net/10356/160593
ISSN: 2569-2925
DOI: 10.13154/tches.v2019.i1.209-237
Research Centres: Temasek Laboratories @ NTU 
Rights: © 2018 Stjepan Picek, Annelie Heuser, Alan Jovic, Shivam Bhasin, Francesco Regazzoni. This work is licensed under a Creative Commons Attribution 4.0 International License.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Journal Articles

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