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Title: Optical characterization of grain orientation in crystalline materials
Authors: Gaskey, Bernard
Hendl, Ludwig
Wang, Xiaogang
Seita, Matteo
Keywords: Engineering::Mechanical engineering
Issue Date: 2020
Source: Gaskey, B., Hendl, L., Wang, X. & Seita, M. (2020). Optical characterization of grain orientation in crystalline materials. Acta Materialia, 194, 558-564.
Project: MOE2017-T2-2-119
Journal: Acta Materialia
Abstract: Characterizing crystallographic orientation is essential for assessing structure-property relationships in crystalline solids. While diffraction methods have dominated this field, low throughput and high cost limit their applicability to small, specialized samples and restrict access to well-funded research institutions. We develop a complementary method that expands applicability and broadens access. We demonstrate crystal orientation mapping over centimeter-scale surfaces using nothing more than a conventional optical microscope and commercial laptop. Our approach relies on a novel analysis method that correlates crystal lattice orientation to optical reflectance of specially etched surfaces. We successfully apply the method to metal and semiconductor surfaces. The simplicity, low cost, and enhanced sample throughput of our method promise to expand the availability of crystallographic orientation mapping significantly, making it readily available in education as well as academic research and industrial settings.
ISSN: 1359-6454
DOI: 10.1016/j.actamat.2020.05.027
Schools: School of Mechanical and Aerospace Engineering 
School of Materials Science and Engineering 
Rights: © 2020 The Authors. Published by Elsevier Ltd on behalf of Acta Materialia Inc. This is an open access article under the CC BY-NC-ND license (
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles
MSE Journal Articles

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