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Title: Demonstration of negative refraction induced by synthetic gauge fields
Authors: Yang, Yihao
Ge, Yong
Li, Rujiang
Lin, Xiao
Jia, Ding
Guan, Yi-Jun
Yuan, Shou-Qi
Sun, Hong-Xiang
Chong, Yidong
Zhang, Baile
Keywords: Science::Physics
Issue Date: 2021
Source: Yang, Y., Ge, Y., Li, R., Lin, X., Jia, D., Guan, Y., Yuan, S., Sun, H., Chong, Y. & Zhang, B. (2021). Demonstration of negative refraction induced by synthetic gauge fields. Science Advances, 7(50), eabj2062-.
Project: MOE2016-T3-1-006 
Journal: Science Advances 
Abstract: Negative refraction is a counterintuitive wave phenomenon that has inspired the development of metamaterials and metasurfaces with negative refractive indices and surface phase discontinuities, respectively. Recent theories have proposed an alternative mechanism for negative refraction: Synthetic gauge fields, induced by either dynamical modulation or motion, can shift a material’s dispersion in momentum space, forcing a positive refractive index medium to exhibit negative refraction above a certain threshold. However, this phenomenon has not previously been observed. Here, we report on the experimental demonstration of gauge field–induced negative refraction in a twisted bilayer acoustic metamaterial. The synthetic gauge fields arise in a projected two-dimensional geometry and can be continuously tuned by varying the wave number along the third dimension. Gauge field–induced waveguiding with backward-propagating modes is also demonstrated in a trilayer configuration. These results introduce a mechanism for performing wave manipulation in artificially engineered materials.
ISSN: 2375-2548
DOI: 10.1126/sciadv.abj2062
DOI (Related Dataset): 10.21979/N9/T6YXVC
Schools: School of Physical and Mathematical Sciences 
Research Centres: Centre for Disruptive Photonic Technologies (CDPT) 
The Photonics Institute 
Rights: © 2021 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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