Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/161239
Title: Utilizing the dead-time effect to achieve decentralized reactive power sharing in islanded AC microgrids
Authors: Qi, Yang
Fang, Jingyang
Tang, Yi
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Qi, Y., Fang, J. & Tang, Y. (2019). Utilizing the dead-time effect to achieve decentralized reactive power sharing in islanded AC microgrids. IEEE Journal of Emerging and Selected Topics in Power Electronics, 8(3), 2350-2361. https://dx.doi.org/10.1109/JESTPE.2019.2904077
Project: 2018-T1-001-150 (RG 90/18)
Journal: IEEE Journal of Emerging and Selected Topics in Power Electronics
Abstract: In islanded ac microgrids, distributed energy storage systems (DESSs) are normally coupled to the grid through voltage source inverters (VSIs). To improve the operation efficiency and to avoid overloading, it is desirable that VSIs can share active and reactive powers in proportion to their respective power ratings. Although accurate active power sharing can be easily guaranteed by frequency droop control, it is difficult to achieve reactive power sharing as desired due to mismatched grid impedances and voltage sensor scaling errors. To overcome this challenge, a decentralized reactive power control scheme is proposed and used in conjunction with the conventional voltage droop control to enhance the reactive power sharing performance. Specifically, the proposed control scheme utilizes the dead-time effect to equalize the power factors of all VSIs. As a result, the reactive power sharing performance is improved in a fully decentralized manner. Finally, simulation and experimental results are provided to validate the effectiveness of the proposed control scheme.
URI: https://hdl.handle.net/10356/161239
ISSN: 2168-6777
DOI: 10.1109/JESTPE.2019.2904077
Schools: School of Electrical and Electronic Engineering 
Interdisciplinary Graduate School (IGS) 
Rights: © 2019 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles
IGS Journal Articles

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