Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/161841
Title: Single-shot multi-view imaging enabled by scattering lens
Authors: Zhu, Xiangwen
Sahoo, Sujit Kumar
Wang, Dong
Lam, Huy Quoc
Surman, Philip Anthony
Li, Dayan
Dang, Cuong
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Zhu, X., Sahoo, S. K., Wang, D., Lam, H. Q., Surman, P. A., Li, D. & Dang, C. (2019). Single-shot multi-view imaging enabled by scattering lens. Optics Express, 27(26), 37164-37171. https://dx.doi.org/10.1364/OE.27.037164
Project: MOE2017-T1-002-142 
Journal: Optics Express 
Abstract: Imaging three-dimensional (3D) objects has been realized by methods such as binocular stereo vision and multi-view imaging. These methods, however, needs multiple cameras or multiple shots to get elemental images. In this paper, we develop a single-shot multi-view imaging technique by utilizing the natural randomness of scattering media. By exploiting the memory effect and uncorrelated point spread functions (PSF) among scattering media, we demonstrate that both stereo imaging with large disparity and up to seven-view imaging of a 3D object can be reconstructed from only one speckle pattern by deconvolution. The elemental images are consistent with 3D object projection and images taken by multi-shot imaging. Our technique provides a feasible method to capture multi-view imaging with short acquisition time and easy calibration.
URI: https://hdl.handle.net/10356/161841
ISSN: 1094-4087
DOI: 10.1364/OE.27.037164
Schools: School of Electrical and Electronic Engineering 
Research Centres: Centre for OptoElectronics and Biophotonics (COEB)
Temasek Laboratories @ NTU 
Rights: © 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for noncommercial purposes and appropriate attribution is maintained. All other rights are reserved.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
TL Journal Articles

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