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Title: Wide-angle tunable critical coupling in nanophotonic optical coatings with low-loss phase change material
Authors: Sreekanth, Kandammathe Valiyaveedu
Prabhathan, Patinharekandy
Chaturvedi, Apoorva
Lekina, Yulia
Han, Song
Zexiang, Shen
Teo, Edwin Hang Tong
Teng, Jinghua
Singh, Ranjan
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2022
Source: Sreekanth, K. V., Prabhathan, P., Chaturvedi, A., Lekina, Y., Han, S., Zexiang, S., Teo, E. H. T., Teng, J. & Singh, R. (2022). Wide-angle tunable critical coupling in nanophotonic optical coatings with low-loss phase change material. Small, 18(28), e2202005-.
Project: A18A5b0056
Journal: Small
Abstract: Realizing perfect light absorption in stacked thin films of dielectrics and metals through critical light coupling has recently received intensive research attention. In addition, realizing ultra-thin perfect absorber and tunable perfect absorber in the visible spectrum is essential for novel optoelectronics applications. However, the existing thin film stacks cannot show tunable perfect absorption in a wide-angle range. Here, a tunable perfect absorption from normal incidence to a wide-angle range (0° to 70°) by utilizing a two-layer stack consisting of a high refractive index low-loss dielectric on a high reflecting metal is proposed. This is experimentally demonstrated by depositing a thin layer of low-loss phase change material such as stibnite (Sb2 S3 ) on a thin layer of silver. This structure shows tunable perfect absorption with large spectral tunability in the visible wavelength. Furthermore, the absorption enhancement in 2D materials by transferring monolayer molybdenum disulfide on the stack, which shows 96% light absorption with enhanced photoluminescence, is demonstrated. In addition, the thin film stack can work as a scalable phase modulator offering a maximum phase tunability of ≈140° by changing the structural state of Sb2 S3 from amorphous to crystalline.
ISSN: 1613-6810
DOI: 10.1002/smll.202202005
Rights: © 2022 Wiley-VCH GmbH. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles
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