Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/162370
Title: Strut-and-tie and finite element modelling of unsymmetrically-loaded deep beams
Authors: Fan, Shengxin
Zhang, Yao
Ma, You-Xin
Tan, Kang Hai
Keywords: Engineering::Civil engineering
Issue Date: 2022
Source: Fan, S., Zhang, Y., Ma, Y. & Tan, K. H. (2022). Strut-and-tie and finite element modelling of unsymmetrically-loaded deep beams. Structures, 36, 805-821. https://dx.doi.org/10.1016/j.istruc.2021.12.037
Project: L2NICCFP1-2013-4 
Journal: Structures
Abstract: A strut-and-tie model (STM) for unsymmetrically-loaded deep beams is proposed in this paper through simplifying the unsymmetrical problem into symmetrical and anti-symmetrical problems. This analytical solution starts with derivations of principal compressive stress fields based on the theory of elasticity. Furthermore, a minimum-strain-energy criterion is adopted to define the optimal STM geometry from the stress field, including the dimensions of struts and nodal zones, and strut angles. The proposed STM is validated against 140 test results, including 14 unsymmetrically-loaded deep beams and 126 symmetric deep and short beams, and finite element models (FEMs) for the 14 unsymmetrical deep beams. The FEM is also used to simulate the load-displacement relationships of unsymmetrical deep beams that could not be modelled by STM. In addition, a worked example is presented to demonstrate in detail the procedure of analysing an unsymmetrically-loaded deep beam using the proposed solution. In summary, the STM predictions are in good agreement with experimental results and FEM predictions. Therefore, the proposed STM is capable of giving accurate and consistent predictions for both symmetrical and unsymmetrical deep and short beams.
URI: https://hdl.handle.net/10356/162370
ISSN: 2352-0124
DOI: 10.1016/j.istruc.2021.12.037
Rights: © 2021 Published by Elsevier Ltd on behalf of Institution of Structural Engineers. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:CEE Journal Articles

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