Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/162499
Title: Low-temperature atomic layer deposited electron transport layers for co-evaporated perovskite solar cells
Authors: Erdenebileg, Enkhtur
Wang, Hao
Li, Jia
Singh, Nandan
Dewi, Herlina Arianita
Tiwari, Nidhi
Mathews, Nripan
Mhaisalkar, Subodh Gautam
Bruno, Annalisa
Keywords: Engineering::Materials
Issue Date: 2022
Source: Erdenebileg, E., Wang, H., Li, J., Singh, N., Dewi, H. A., Tiwari, N., Mathews, N., Mhaisalkar, S. G. & Bruno, A. (2022). Low-temperature atomic layer deposited electron transport layers for co-evaporated perovskite solar cells. Solar RRL, 6(1), 2100842-. https://dx.doi.org/10.1002/solr.202100842
Project: Solar CRP (S18-1176-SCRP)
NRF2018-ITC001-001 
Journal: Solar RRL
Abstract: In this work, we explore the potentials and the characteristics of electron-transporting layers (ETL) grown by atomic layer deposition (ALD) at low temperature in co-evaporated perovskite solar cells (PSCs). The thermal-based ALD process has been investigated by tuning the main growing conditions as the number of cycles and the growth temperature. We show that un-annealed ALD-SnO2 thin films grown at temperatures between 80 °C and 100 °C are efficient ETL in n.i.p co-evaporated MAPbI3 PSCs which can achieve power conversion efficiencies (PCEs) consistently above 18%. Moreover, the champion PSC achieved a PCE of 19.30% at 120 °C with 150 cycles. We show that the low-temperature processed ALD SnO2 is very promising for flexible, large-area PSCs and mini-modules. We also report the first co-evaporated PSCs employing low temperature processed ALD ZnO with PCEs approaching 18%. This work demonstrates the potential of the low-temperature ALD deposition method as a potential route to fabricate efficient PSCs at low temperatures.
URI: https://hdl.handle.net/10356/162499
ISSN: 2367-198X
DOI: 10.1002/solr.202100842
DOI (Related Dataset): 10.21979/N9/JYKA5P
Schools: School of Materials Science and Engineering 
Research Centres: Energy Research Institute @ NTU (ERI@N) 
Rights: © 2021 Wiley-VCH GmbH. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:ERI@N Journal Articles
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