Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/163504
Title: Investigation of device-level vulnerabilities in advanced embedded systems
Authors: How, Yu Sing
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2022
Publisher: Nanyang Technological University
Source: How, Y. S. (2022). Investigation of device-level vulnerabilities in advanced embedded systems. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/163504
Project: A2371-212
Abstract: With the increasing popularity of embedded systems, security and privacy concerns poses a huge threat to users due to the vulnerabilities of these devices. Fault injection is one of the many methods of physically accessing such devices. Fault injection attack provides a powerful method to inject faults into the embedded devices, which allows the attacker to precisely set the necessary parameters such as the location and timing on the chip that is being attacked. This project aims to propose an approach to integrate and introduce new devices to the platform for the laser fault injection attack. On top of that, previous work has proved that the implementation of the attack on the Atmel AT-mega328P board was successful, and therefore, would like to try and replicate the same attack with a different laser system. Through this project, new vulnerabilities might be identified, which would increase the security of embedded devices.
URI: https://hdl.handle.net/10356/163504
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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