Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/163747
Title: CIM-Spin: a scalable CMOS annealing processor with digital in-memory spin operators and register spins for combinatorial optimization problems
Authors: Su, Yuqi
Kim, Hyunjoon
Kim, Bongjin
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2022
Source: Su, Y., Kim, H. & Kim, B. (2022). CIM-Spin: a scalable CMOS annealing processor with digital in-memory spin operators and register spins for combinatorial optimization problems. IEEE Journal of Solid-State Circuits, 57(7), 2263-2273. https://dx.doi.org/10.1109/JSSC.2021.3139901
Journal: IEEE Journal of Solid-State Circuits
Abstract: Recently, annealing processors based on the Ising model have received rising attention as efficient alternative hardware for solving combinatorial optimization problems. After mapping a problem to the hardware Ising model, we can observe the natural convergence behavior of the Ising model and find potential solutions to the problem. The quantum annealing processor has shown effectiveness in finding better solutions to the problems by using quantum bits (qubits) with annealing based on their quantum tunneling behaviors. However, the annealing processor based on the emerging quantum technology faces challenges such as limited scalability, high energy consumption, and operating costs due to the extremely low operating temperature. As a low-cost alternative, a CMOS annealing processor has been recently developed and drawn increasing attention thanks to the advantages over its quantum counterpart, including better scalability and lower energy consumption. In this work, we present a digital CMOS annealing processor with in-memory spin operators and register spins. The proposed CMOS annealing processor achieves > 10× energy efficiency and faster operation than state-of-the-art works.
URI: https://hdl.handle.net/10356/163747
ISSN: 0018-9200
DOI: 10.1109/JSSC.2021.3139901
Rights: © 2022 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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