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Title: Ultrafast dynamical charge-lattice coupling in rare-earth nickelate thin films studied by time-resolved terahertz spectroscopy
Authors: Kinha, Monu
Prajapati, G. L.
Udeshi, Malay
Agarwal, Piyush
Ram, N. Bhargava
Rana, D. S.
Keywords: Science::Physics
Issue Date: 2022
Source: Kinha, M., Prajapati, G. L., Udeshi, M., Agarwal, P., Ram, N. B. & Rana, D. S. (2022). Ultrafast dynamical charge-lattice coupling in rare-earth nickelate thin films studied by time-resolved terahertz spectroscopy. Journal of Physics D: Applied Physics, 55(22), 225301-.
Journal: Journal of Physics D: Applied Physics
Abstract: Rare-earth nickelates exhibit a rich phase diagram formed by the complex interplay of intertwined and competing energetics of fundamental entities. To unwind the coupling and interaction mechanisms of fundamental entities underneath, time-resolved terahertz (THz) spectroscopy was implemented to understand non-equilibrium carrier and lattice dynamics of epitaxial thin films of La x Eu1-x NiO3 (x = 0, 0.25, 0.50, 1) systems, where x = 0 is insulating while remaining are metallic at room temperature. The THz transmittance of the insulating and metallic phases exhibit contrasting photo-induced phases associated with bi-exponential and mono-exponential relaxation mechanisms, respectively. A pronounced oscillatory feature superimposed on the mono-exponential relaxation manifests only in the metallic phase. As ascribed to the acoustic phonons, the 'x' dependent behavior of this feature reveals an inverse relation between the strength of electron-phonon coupling and the magnitude of conductivity. In the insulating state, in contrast, the relaxation time constants are associated with the recovery of charge-ordering and electron-phonon thermalization. This dynamical lattice-charge interaction study demonstrates use of this ultrafast phenomena in nickelate thin films in new generation ultrafast photo-acoustic devices as an alternate to conventional surface acoustic wave device.
ISSN: 0022-3727
DOI: 10.1088/1361-6463/ac5698
Rights: © 2022 IOP Publishing Ltd. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
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