Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/164626
Title: Simultaneous ultraviolet, visible, and near-infrared continuous-wave lasing in a rare-earth-doped microcavity
Authors: Jiang, Bo
Zhu, Song
Ren, Linhao
Shi, Lei
Zhang, Xinliang
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2022
Source: Jiang, B., Zhu, S., Ren, L., Shi, L. & Zhang, X. (2022). Simultaneous ultraviolet, visible, and near-infrared continuous-wave lasing in a rare-earth-doped microcavity. Advanced Photonics, 4(4), 46003-1-46003-8. https://dx.doi.org/10.1117/1.AP.4.4.046003
Journal: Advanced Photonics 
Abstract: Microlaser with multiple lasing bands is critical in various applications, such as full-color display, optical communications, and computing. Here, we propose a simple and efficient method for homogeneously doping rare earth elements into a silica whispering-gallery microcavity. By this method, an Er-Yb co-doped silica microsphere cavity with the highest quality (Q) factor (exceeding 108) among the rare-earth-doped microcavities is fabricated to demonstrate simultaneous and stable lasing covering ultraviolet, visible, and near-infrared bands under room temperature and a continuous-wave pump. The thresholds of all the lasing bands are estimated to be at the submilliwatt level, where both the ultraviolet and violet continuous wave upconversion lasing from rare earth elements has not been separately demonstrated under room temperature until this work. This ultrahigh-Q doped microcavity is an excellent platform for high-performance multiband microlasers, ultrahigh-precision sensors, optical memories, and cavity-enhanced light-matter interaction studies.
URI: https://hdl.handle.net/10356/164626
ISSN: 2577-5421
DOI: 10.1117/1.AP.4.4.046003
Schools: School of Electrical and Electronic Engineering 
Rights: © The Authors. Published by SPIE and CLP under a Creative Commons Attribution 4.0 International License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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