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Title: Low-capacitance solid-state transformer control using an analytic filter
Authors: Sarda, Radhika
Rodriguez, Ezequiel
Yadav, Naga Brahmendra Gorla
Farivar, Glen G.
Pou, Josep
Sriram, Vaisambhayana Brihadeeswara
Tripathi, Anshuman
Keywords: Engineering::Electrical and electronic engineering::Electric power::Production, transmission and distribution
Engineering::Electrical and electronic engineering::Power electronics
Issue Date: 2023
Source: Sarda, R., Rodriguez, E., Yadav, N. B. G., Farivar, G. G., Pou, J., Sriram, V. B. & Tripathi, A. (2023). Low-capacitance solid-state transformer control using an analytic filter. 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia).
Conference: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia)
Abstract: In the modular three-stage solid-state transformer (SST), each phase is integrated with large dc-link capacitors as energy buffers, to filter the second harmonic capacitor voltage ripple generated due to single-phase power processing. Although large dc-link capacitors reduce the coupling between stages of the SST and simplify the controller design, they compromise the reliability, safety and power density of the SST. Accordingly, a low-capacitance SST is desirable to address these challenges. To provide a high-bandwidth control for the low-capacitance SST, this paper proposes using an analytic filtering scheme rather than the low-pass filters used in conventional SST control schemes. A portion of the second harmonic power ripple in the high-voltage dc-link capacitors is processed by the SST’s dc-dc stage to facilitate the use of low capacitance. The effectiveness of the proposed control is demonstrated through a simulation study in PLECS.
DOI: 10.23919/ICPE2023-ECCEAsia54778.2023.10213621
Schools: Interdisciplinary Graduate School (IGS) 
School of Electrical and Electronic Engineering 
Research Centres: Energy Research Institute @ NTU (ERI@N) 
Rights: © 2023 KIPE. Published by IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at:
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:IGS Conference Papers

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