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https://hdl.handle.net/10356/167767
Title: | Circuits for security | Authors: | Muhammad Aznin Bin Abdul Aziz | Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2023 | Publisher: | Nanyang Technological University | Source: | Muhammad Aznin Bin Abdul Aziz (2023). Circuits for security. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/167767 | Project: | A2159-221 | Abstract: | Internet of things (IOT) usage has been on the rise and will continue to increase as technology improves. This gives rise to a need for better security for the vulnerable IOT. Physical unclonable function (PUF) is one of the techniques that are being used to provide security and SRAM PUF is one of the preferred type of PUF. While being a storage memory, it can simultaneously be used as part of a security system without requiring additional component on the device. Effect of process, voltage and temperature (PVT) on SRAM PUF will be studied and novel idea(s) will be proposed to counter the effect that can degrade the SRAM PUF reliability. | URI: | https://hdl.handle.net/10356/167767 | Schools: | School of Electrical and Electronic Engineering | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
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aznin_finalisedfypreport.pdf Restricted Access | 1.12 MB | Adobe PDF | View/Open |
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