Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/167767
Title: Circuits for security
Authors: Muhammad Aznin Bin Abdul Aziz
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2023
Publisher: Nanyang Technological University
Source: Muhammad Aznin Bin Abdul Aziz (2023). Circuits for security. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/167767
Project: A2159-221
Abstract: Internet of things (IOT) usage has been on the rise and will continue to increase as technology improves. This gives rise to a need for better security for the vulnerable IOT. Physical unclonable function (PUF) is one of the techniques that are being used to provide security and SRAM PUF is one of the preferred type of PUF. While being a storage memory, it can simultaneously be used as part of a security system without requiring additional component on the device. Effect of process, voltage and temperature (PVT) on SRAM PUF will be studied and novel idea(s) will be proposed to counter the effect that can degrade the SRAM PUF reliability.
URI: https://hdl.handle.net/10356/167767
Schools: School of Electrical and Electronic Engineering 
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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