Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/168470
Title: Development of grating for the optical addressing of Sr+ ions with data analysis techniques
Authors: Lim, Yu Dian
Zhao, Peng
Guidoni, Luca
Likforman, Jean-Pierre
Tan, Chuan Seng
Keywords: Engineering::Electrical and electronic engineering::Microelectronics
Issue Date: 2023
Source: Lim, Y. D., Zhao, P., Guidoni, L., Likforman, J. & Tan, C. S. (2023). Development of grating for the optical addressing of Sr+ ions with data analysis techniques. IEEE Photonics Journal, 1-8. https://dx.doi.org/10.1109/JPHOT.2023.3281134
Project: NRF2020-NRF-ANR073 HIT 
Journal: IEEE Photonics Journal 
Abstract: In this study, SiN-based gratings with various radius of curvature (r) are designed and fabricated for the optical addressing of trapped Sr+ ion. The beam width of the light coupled out from the gratings is investigated using a self-developed Python-based data analysis technique. It is found that the r values have insignificant influence on the beam width along x-axis; whereas the beam waist along y-axis reduces from 13.96 to 12.3 µm as r increases from 15 to 20 µm, then increases gradually to 20.51 µm as the r value further increases to 60 µm. The obtained results can provide a versatile solution on the optical addressing of trapped Sr+ for applications in quantum engineering.
URI: https://hdl.handle.net/10356/168470
ISSN: 1943-0655
DOI: 10.1109/JPHOT.2023.3281134
Schools: School of Electrical and Electronic Engineering 
Organisations: Institute of Microelectronics, A∗STAR 
Rights: © 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/JPHOT.2023.3281134.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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