Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/169998
Title: Slice-relation-clustering framework via horizontal angle information for 3-D tree roots reconstruction
Authors: Luo, Wenhao
Lee, Yee Hui
Ow, Lai Fern
Yusof, Mohamed Lokman Mohd
Yucel, Abdulkadir C.
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2023
Source: Luo, W., Lee, Y. H., Ow, L. F., Yusof, M. L. M. & Yucel, A. C. (2023). Slice-relation-clustering framework via horizontal angle information for 3-D tree roots reconstruction. IEEE Transactions On Geoscience and Remote Sensing, 61, 4502110-. https://dx.doi.org/10.1109/TGRS.2023.3272743
Journal: IEEE Transactions on Geoscience and Remote Sensing 
Abstract: Tree root system 3-D reconstruction and spatial distribution analysis are the prevalent aspects of tree root investigation using ground penetrating radar (GPR). Precedent 3-D reconstruction methods are found to be effective in mapping simple, smooth root structures. However, repetitive and dense B-scans are needed; otherwise, the retrieved roots' spatial distribution and growth extension trend accuracy would deteriorate with the increase in the root systems' complexity. To address these issues, this article, for the first time, explores the possibility of integrating the horizontal angle information of the tree roots and a slice-relation-clustering (SRC) algorithm to reconstruct the complex tree root systems in a 3-D manner. The proposed framework, which takes the roots' horizontal angle as an analyzing condition instead of biological properties that are similar among neighboring branches used in the existing methods, clusters preprocessed and focused 2-D reflection patterns from the same single root together. The whole roots system is the combination of every single root cluster. Real measurement results show that our proposed method achieves a high efficiency in accurate root system reconstruction.
URI: https://hdl.handle.net/10356/169998
ISSN: 0196-2892
DOI: 10.1109/TGRS.2023.3272743
Schools: School of Electrical and Electronic Engineering 
Rights: © 2023 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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