Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/169998
Title: | Slice-relation-clustering framework via horizontal angle information for 3-D tree roots reconstruction | Authors: | Luo, Wenhao Lee, Yee Hui Ow, Lai Fern Yusof, Mohamed Lokman Mohd Yucel, Abdulkadir C. |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2023 | Source: | Luo, W., Lee, Y. H., Ow, L. F., Yusof, M. L. M. & Yucel, A. C. (2023). Slice-relation-clustering framework via horizontal angle information for 3-D tree roots reconstruction. IEEE Transactions On Geoscience and Remote Sensing, 61, 4502110-. https://dx.doi.org/10.1109/TGRS.2023.3272743 | Journal: | IEEE Transactions on Geoscience and Remote Sensing | Abstract: | Tree root system 3-D reconstruction and spatial distribution analysis are the prevalent aspects of tree root investigation using ground penetrating radar (GPR). Precedent 3-D reconstruction methods are found to be effective in mapping simple, smooth root structures. However, repetitive and dense B-scans are needed; otherwise, the retrieved roots' spatial distribution and growth extension trend accuracy would deteriorate with the increase in the root systems' complexity. To address these issues, this article, for the first time, explores the possibility of integrating the horizontal angle information of the tree roots and a slice-relation-clustering (SRC) algorithm to reconstruct the complex tree root systems in a 3-D manner. The proposed framework, which takes the roots' horizontal angle as an analyzing condition instead of biological properties that are similar among neighboring branches used in the existing methods, clusters preprocessed and focused 2-D reflection patterns from the same single root together. The whole roots system is the combination of every single root cluster. Real measurement results show that our proposed method achieves a high efficiency in accurate root system reconstruction. | URI: | https://hdl.handle.net/10356/169998 | ISSN: | 0196-2892 | DOI: | 10.1109/TGRS.2023.3272743 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2023 IEEE. All rights reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
SCOPUSTM
Citations
50
4
Updated on May 1, 2025
Page view(s)
166
Updated on May 6, 2025
Google ScholarTM
Check
Altmetric
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.