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Title: Modeling e-learning effectiveness and usability
Authors: Leong, Lock Wah.
Keywords: DRNTU::Engineering::Computer science and engineering::Computer applications::Computers in other systems
Issue Date: 2009
Abstract: For the last two decades, many organizations, junior schools, Universities and educational institutions have been investing in the information technologies to improve education and training at an increasing rate. Especially in the corporate worlds, there is strong push for continuous education and training for their human resources that are critical to an organization’s success. Electronic Learning (E-Learning) has been identified as the key enabler for people and organizations to keep up with changes in the global economy that now occur in the fast Internet time. However, it is also important to note that most E-learning programs exhibit higher dropout rates when compared with traditional instructor-led courses. Therefore, it is important to establish the Effectiveness and Usability evaluation method/model for E-Learning applications. There is on going study in the evaluation of the Effectiveness and Usability of E-Learning applications. In this report, we review the theoretical and practicality for adopting Kirkpatrick model and the Usability method approach to measure the Effectiveness and Usability of E-Learning applications. The Kirkpatrick model and the Usability method are combined into questionnaire to obtain feedback from users after their E-Learning training. From the study conducted so far, the questionnaire itself is getting positive feedback from users on its accuracy. Adopting the questionnaire approach to collect feedback from users is usually quick and cost effective to administer and to implement the measurement. The approach to conduct the survey and the analyze of the results are documented in the report. Furthermore, recommendation for further research is also discussed.
Rights: Nanyang Technological University
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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