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https://hdl.handle.net/10356/171255
Title: | A non-unit line protection method for MMC-HVDC grids based on the curvatures of backward traveling waves | Authors: | Xie, Fan Hao, Zhiguo Ye, Dongmeng Yang, Songhao Li, Chuanxi Dai, Guoan Zhang, Baohui Wang, Ting |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2023 | Source: | Xie, F., Hao, Z., Ye, D., Yang, S., Li, C., Dai, G., Zhang, B. & Wang, T. (2023). A non-unit line protection method for MMC-HVDC grids based on the curvatures of backward traveling waves. International Journal of Electrical Power and Energy Systems, 153, 109373-. https://dx.doi.org/10.1016/j.ijepes.2023.109373 | Journal: | International Journal of Electrical Power and Energy Systems | Abstract: | The existing protection techniques for high-voltage direct-current (HVDC) grids suffer from several shortcomings such as high sampling frequency, poor robustness, and reliance on simulation for threshold setting. To solve these problems, this paper proposes a non-unit protection method for modular multilevel converter (MMC)-based HVDC grids using the curvatures of backward traveling waves. To this end, the propagation characteristics of traveling waves and the boundary characteristics of DC lines are first studied, then the analytical expressions of backward traveling waves are derived. Moreover, the curvatures of backward traveling waves are analyzed. On this basis, a non-unit protection method is proposed, including zone selection, disturbance identification, and pole selection. At last, with a protection platform and a real-time digital simulator (RTDS) platform of the MMC-HVDC grid, the accuracy and the robustness of the proposed protection method are verified. The results show that the protection method can correctly identify faults with different distances and resistance in 1 ms and has strong robustness against transition resistance, sampling frequency, boundary value, noise, system topology, and line parameters. | URI: | https://hdl.handle.net/10356/171255 | ISSN: | 0142-0615 | DOI: | 10.1016/j.ijepes.2023.109373 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2023 Elsevier Ltd. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/). | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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1-s2.0-S0142061523004301-main.pdf | 2.67 MB | Adobe PDF | ![]() View/Open |
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