Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/171255
Title: A non-unit line protection method for MMC-HVDC grids based on the curvatures of backward traveling waves
Authors: Xie, Fan
Hao, Zhiguo
Ye, Dongmeng
Yang, Songhao
Li, Chuanxi
Dai, Guoan
Zhang, Baohui
Wang, Ting
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2023
Source: Xie, F., Hao, Z., Ye, D., Yang, S., Li, C., Dai, G., Zhang, B. & Wang, T. (2023). A non-unit line protection method for MMC-HVDC grids based on the curvatures of backward traveling waves. International Journal of Electrical Power and Energy Systems, 153, 109373-. https://dx.doi.org/10.1016/j.ijepes.2023.109373
Journal: International Journal of Electrical Power and Energy Systems 
Abstract: The existing protection techniques for high-voltage direct-current (HVDC) grids suffer from several shortcomings such as high sampling frequency, poor robustness, and reliance on simulation for threshold setting. To solve these problems, this paper proposes a non-unit protection method for modular multilevel converter (MMC)-based HVDC grids using the curvatures of backward traveling waves. To this end, the propagation characteristics of traveling waves and the boundary characteristics of DC lines are first studied, then the analytical expressions of backward traveling waves are derived. Moreover, the curvatures of backward traveling waves are analyzed. On this basis, a non-unit protection method is proposed, including zone selection, disturbance identification, and pole selection. At last, with a protection platform and a real-time digital simulator (RTDS) platform of the MMC-HVDC grid, the accuracy and the robustness of the proposed protection method are verified. The results show that the protection method can correctly identify faults with different distances and resistance in 1 ms and has strong robustness against transition resistance, sampling frequency, boundary value, noise, system topology, and line parameters.
URI: https://hdl.handle.net/10356/171255
ISSN: 0142-0615
DOI: 10.1016/j.ijepes.2023.109373
Schools: School of Electrical and Electronic Engineering 
Rights: © 2023 Elsevier Ltd. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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