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Title: Reducing radar cross section of flat metallic targets using checkerboard metasurface: design, analysis, and realization
Authors: Wang, Chao
Wang, Ru-Zhi
Zhang, Sheng-Jun
Wang, Han
Wang, Wensong
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2023
Source: Wang, C., Wang, R., Zhang, S., Wang, H. & Wang, W. (2023). Reducing radar cross section of flat metallic targets using checkerboard metasurface: design, analysis, and realization. Journal of Applied Physics, 134(4), 044902-1-044902-15.
Journal: Journal of Applied Physics 
Abstract: Aiming at the large-scale application of metasurface in the field of radar stealth, we present a hybrid resonance-based and dispersion substrate integrated checkerboard metasurface (CMS) for reducing the radar cross section (RCS) of flat metallic targets. Considering the frequency-dependent characteristics of such a dispersion material, a pair of single and dual resonant artificial magnetic conductor meta-atoms with the modified “crusades-like” cell topologies is employed to maximize the operating bandwidth; besides, a comprehensive and thorough investigation on the resonance mechanism is conducted in this paper to provide an intuitive physical insight of meta-atoms’ reflection responses. By comparing the predicted results with simulations, the quasi-periodic effect is introduced to explain the frequency shift of 10 dB RCS reduction bandwidth. In the implementation procedure, a prototype of the designed RCS reducer with a total dimension of 180 × 180 mm2 is fabricated and measured, the 10 dB RCS reduction bandwidth of theoretical simulation and experimental measurement are basically consistent, and the performance improvement of 8 dB RCS reduction in the experimental results can be attributed to the dispersion effects of the dielectric substrate. With a better figure of merit, our efforts may serve as a useful exemplar for the economical CMS architecture in radar evasive applications.
ISSN: 0021-8979
DOI: 10.1063/5.0154916
Schools: School of Electrical and Electronic Engineering 
Rights: © 2023 Author(s). Published under an exclusive license by AIP Publishing. All rights reserved. This article may be downloaded for personal use only. Any other use requires prior permission of the copyright holder. The Version of Record is available online at
Fulltext Permission: embargo_20240730
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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