Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/172324
Title: | VNA-based fixture adapters for wideband accurate impedance extraction of single-phase EMI filtering chokes | Authors: | Jie, Huamin Gao, Si-Ping Zhao, Zhenyu Fan, Fei Sasongko, Firman Gupta, Amit Kumar See, Kye Yak |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2023 | Source: | Jie, H., Gao, S., Zhao, Z., Fan, F., Sasongko, F., Gupta, A. K. & See, K. Y. (2023). VNA-based fixture adapters for wideband accurate impedance extraction of single-phase EMI filtering chokes. IEEE Transactions On Industrial Electronics, 70(8), 7821-7831. https://dx.doi.org/10.1109/TIE.2023.3239906 | Journal: | IEEE Transactions on Industrial Electronics | Abstract: | Differential-mode and common-mode chokes (DMC and CMC) are key components of electromagnetic interference filters. Accurate impedance knowledge of these chokes allows optimal EMI filter design to meet the conducted emission requirements. An impedance analyzer or vector network analyzer with a fixture adapter is commonly adopted for impedance measurement of a passive component. Usually, the non-standard terminals of both DMC and CMC make them incompatible for direct mounting on commercially available fixture adapters. Relying on additional interconnects to the fixture adapters introduce inherent parasitic effects that limit measurement accuracy up to several megahertz. This article proposes a design method of customized fixture adapters which are specifically tailored for impedance measurement of single-phase DMC and CMC. Through a systematic parasitic de-embedding process, the choke impedance can be extracted with excellent accuracy up to 120 MHz. | URI: | https://hdl.handle.net/10356/172324 | ISSN: | 0278-0046 | DOI: | 10.1109/TIE.2023.3239906 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2023 IEEE. All rights reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
SCOPUSTM
Citations
20
28
Updated on Mar 13, 2025
Page view(s)
123
Updated on Mar 20, 2025
Google ScholarTM
Check
Altmetric
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.