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https://hdl.handle.net/10356/173117
Title: | An empirical study of the inherent resistance of knowledge distillation based federated learning to targeted poisoning attacks | Authors: | He, Weiyang Liu, Zizhen Chang, Chip Hong |
Keywords: | Engineering::Computer science and engineering::Computing methodologies::Artificial intelligence | Issue Date: | 2023 | Source: | He, W., Liu, Z. & Chang, C. H. (2023). An empirical study of the inherent resistance of knowledge distillation based federated learning to targeted poisoning attacks. 2023 IEEE 32nd Asian Test Symposium (ATS). https://dx.doi.org/10.1109/ATS59501.2023.10317993 | Project: | NRF2018NCRNCR009-0001 | Conference: | 2023 IEEE 32nd Asian Test Symposium (ATS) | Abstract: | While the integration of Knowledge Distillation (KD) into Federated Learning (FL) has recently emerged as a promising solution to address the challenges of heterogeneity and communication efficiency, little is known about the security of these schemes against poisoning attacks prevalent in vanilla FL. From recent countermeasures built around KD, we conjecture that the way knowledge is distilled from the global model to the local models and the type of knowledge transfer by KD themselves offer some resilience against targeted poisoning attacks in FL. To attest this hypothesis, we systematize various adversary agnostic state-of-the-art KD-based FL algorithms for the evaluation of their resistance to different targeted poisoning attacks on two vision recognition tasks. Our empirical security-utility trade-off study indicates surprisingly good inherent immunity of certain KD-based FL algorithms that are not designed to mitigate these attacks. By probing into the causes of their robustness, the KD space exploration provides further insights into the balancing of security, privacy and efficiency triad in different FL settings. | URI: | https://hdl.handle.net/10356/173117 | ISBN: | 9798350303100 | ISSN: | 2377-5386 | DOI: | 10.1109/ATS59501.2023.10317993 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2023 IEEE. All rights reserved. This article may be downloaded for personal use only. Any other use requires prior permission of the copyright holder. The Version of Record is available online at http://doi.org/10.1109/ATS59501.2023.10317993. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Conference Papers |
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