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|Title:||Identification of partial discharges using advanced photonics technology||Authors:||Yong, Jolin Li Zhuang.||Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics||Issue Date:||2009||Abstract:||The electrical equipments are widely used in various industrial sectors such as power engineering. For all power equipments, the insulation system will deteriorate with time due to occurrence of partial discharges (PD). In order to prevent failure of electrical equipments, it is desirable to monitor while it is still functioning by identifying and measuring PD pulses using optical method. The report introduces the concepts of partial discharges and fiber optics. It provides detailed information on the corona and surface discharges. It also provides technical concept on Law of Reflection, Law of Refraction and Total Internal Reflection. In this report, it focuses on the aspects of optoelectronic system. Using optoelectronic system, the PD can be identified in sheltered high voltage device. The structure of the system consists of a voltage variac, a step-up transformer, PD samples, a probe, a photodetector and an amplification circuit. Besides that, a spectrometer analyzer is used as a detector to capture the spectrum of the output signal. This report highlights the processes in creating the individual components of the optoelectronic system which include coupling of fibers, arrangement of PD samples, construction and design of photodetector and amplification circuits. It also provides the results collected from the investigation of PD pulses. Finally, the choice of the better combination of fibers is selected based on the observation of light intensity from the output spectrum. Besides that, the output voltage is collected using digital multi-meter. An analysis is conducted to understand the results collected from the experiment.||URI:||http://hdl.handle.net/10356/17338||Rights:||Nanyang Technological University||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Student Reports (FYP/IA/PA/PI)|
checked on Sep 30, 2020
checked on Sep 30, 2020
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