Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/175366
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dc.contributor.authorHtet Thiri Zawen_US
dc.date.accessioned2024-04-22T05:45:02Z-
dc.date.available2024-04-22T05:45:02Z-
dc.date.issued2024-
dc.identifier.citationHtet Thiri Zaw (2024). Machine learning based image analysis for surface defect detection. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/175366en_US
dc.identifier.urihttps://hdl.handle.net/10356/175366-
dc.description.abstractThe progressive and intelligent advancement of the manufacturing industry demands precise quality control to ensure product excellence. The surface defects that arise during the manufacturing processes pose significant concern as they can lead to quality issues and compromise production integrity. The traditional surface defect detection methods, reliant upon human-driven visual inspection, are limited by accuracy, speed, and adaptability across diverse defect categories. To address these challenges, this project introduces an innovative approach that utilizes the application of advanced machine vision techniques, known for enhancing the efficiency, performance, and reliability of defect detection. Currently, the machine vision-based defect detection methodologies often rely on conventional image processing algorithms. However, these methods prove inadequate in achieving optimal results and the existing literature on automated detection in this area is limited. Therefore, this project proposes a novel methodology that leverages Convolutional Neural Networks (CNNs) to automate the process of detecting surface defects. The primary focus of this project lies in the formulation and execution of a CNN-based image analysis framework specifically tailored for accurate surface defect detection and identification.en_US
dc.language.isoenen_US
dc.publisherNanyang Technological Universityen_US
dc.relationPSCSE22-0061en_US
dc.subjectComputer and Information Scienceen_US
dc.subjectEngineeringen_US
dc.titleMachine learning based image analysis for surface defect detectionen_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorZheng Jianminen_US
dc.contributor.schoolSchool of Computer Science and Engineeringen_US
dc.description.degreeBachelor's degreeen_US
dc.contributor.supervisoremailASJMZheng@ntu.edu.sgen_US
dc.subject.keywordsComputer science and engineeringen_US
dc.subject.keywordsEngineeringen_US
dc.subject.keywordsComputer visionen_US
dc.subject.keywordsMachine learningen_US
dc.subject.keywordsDeep learningen_US
dc.subject.keywordsImage analysisen_US
dc.subject.keywordsPattern recognitionen_US
dc.subject.keywordsNeural network architecturesen_US
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Appears in Collections:SCSE Student Reports (FYP/IA/PA/PI)
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