Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/176767
Title: Automatic DC capacitor reformation
Authors: Lim, Zhixiang
Keywords: Engineering
Issue Date: 2024
Publisher: Nanyang Technological University
Source: Lim, Z. (2024). Automatic DC capacitor reformation. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/176767
Abstract: This project "Automatic DC Capacitor Reformation" addresses the issue of DC capacitors aging and degrading over time as a critical component of electronic systems and power supplies. Over time, DC capacitors have the tendency to lose their effectiveness due to temperature variations, voltage stresses, and long-term usage. It is typically labor-intensive, time-consuming, and prone to error to reform capacitors using traditional methods. Using an innovative solution, this project proposes an automated reforming process for DC capacitors in search to result in improved efficiency, accuracy, reliability, and a minimum amount of human involvement. The proposed system would be having features to allow real-time monitoring and adjusting of reforming parameters ensuring optimal performance and longer capacitor lifecycle, as well as a safety feature that prevent the capacitors from being overcharged or damaged during the reforming process. The control process is performed by Programmable Logic Controller (PLC) coding, which allows monitoring capacitor parameters capability through sensing elements and the parameters are adjusted by activating mechanisms. There are also flexibility and scalability in the system since it can be used with various types and sizes of DC capacitors that is commonly used in various applications. Many industries, for example the automobile, aerospace, telecommunications, and power distribution industries, will be expecting to experience improved reliability and longevity of the DC capacitor and benefit from the implementation of the Automatic DC Capacitor Reformation process to streamline maintenance procedures.
URI: https://hdl.handle.net/10356/176767
Schools: School of Electrical and Electronic Engineering 
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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