Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/177109
Title: Deep learning algorithm to detect tree defects via circular scans
Authors: Nguyen, Thanh Tin
Keywords: Physics
Issue Date: 2024
Publisher: Nanyang Technological University
Source: Nguyen, T. T. (2024). Deep learning algorithm to detect tree defects via circular scans. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/177109
Project: B3002-231 
Abstract: This research aims to advance the accuracy and efficiency of tree defect detection and analysis by integrating Ground-penetrating Radar (GPR) with Deep Learning techniques. It delves into discussions on GPR-based techniques, circular scanning methods for tree imaging, and the application of Convolutional Neural Network (CNN) for deep learning. The report provides detailed insights into the processing of dataset generation, encompassing simulation and measurement techniques. Nonetheless, this chapter includes the procedure for preprocessing and multiplying the dataset for different scenarios by applying edge detection and data augmentation techniques. It further indicates and describes the formulation of the U-net model architecture, a key component of the methodology. For performance evaluation, accuracy metrics such as Structural Similarity Index (SSIM) and error metrics including Mean Squared Error (MSE), Mean Absolute Error (MAE), and Mean Relative Error (MRE) are properly indicated for performance evaluation. Furthermore, the concepts of examining the model quality globally or locally by the Canny edge detection is also introduced and explained. In the subsequent chapter, numerical and graphical performance analyses and findings in experiment and model refining processes are provided, demonstrating the efficacy of the proposed approach in accurately detecting and characterizing tree defects. The study's conclusions summarize the advancements achieved in tree defect detection, emphasizing the significance of the integrated approach. Finally, recommendations for future improvements are proposed.
URI: https://hdl.handle.net/10356/177109
Schools: School of Electrical and Electronic Engineering 
Organisations: NParks 
Fulltext Permission: embargo_restricted_20260520
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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