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https://hdl.handle.net/10356/177137
Title: | AI test bed for real business applications | Authors: | Lim, Japheth Wen Xuan | Keywords: | Engineering | Issue Date: | 2024 | Publisher: | Nanyang Technological University | Source: | Lim, J. W. X. (2024). AI test bed for real business applications. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/177137 | Project: | A3124-231 | Abstract: | With the rapid development of AI algorithms and digitization of business data, it’s never been easier for companies of all sizes to harness the power of AI for business applications. However, AI is such a vast, complex field and businesses are not sure how to use AI in their business. The purpose of this project is to develop a test bed, where most common AI algorithms such Classification, Support Vector Machines, Neural Networks, Logistic Regression etc will be implemented, tested, and compared using business data. This AI test bed will demonstrate how AI algorithms can be used for business applications in order to improve, enhance and bring benefits to various businesses. | URI: | https://hdl.handle.net/10356/177137 | Schools: | School of Electrical and Electronic Engineering | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
Files in This Item:
File | Description | Size | Format | |
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FYP Final Report - LIM WEN XUAN JAPHETH.pdf Restricted Access | 3.47 MB | Adobe PDF | View/Open |
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