Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/177988
Title: Electromagnetic crosstalk isolation with transferred vertically aligned carbon nanotube arrays through thermocompression bonding
Authors: Lum, Lucas
Tan, Dunlin
Tan, Chong Wei
Tay, Beng Kang
Keywords: Engineering
Issue Date: 2024
Source: Lum, L., Tan, D., Tan, C. W. & Tay, B. K. (2024). Electromagnetic crosstalk isolation with transferred vertically aligned carbon nanotube arrays through thermocompression bonding. Carbon, 221, 118943-. https://dx.doi.org/10.1016/j.carbon.2024.118943
Project: MOE2021-T1-001-064
RG55/21
MOE2018-T2-2-105
Journal: Carbon
Abstract: As electronic devices become smaller, more powerful, and operate at higher frequencies, electromagnetic compatibility (EMC) is becoming an ever-greater challenge due to the board real estate required for their proper operation. Thus, this paper presents a solution to augment existing electromagnetic (EM) isolation solutions to increase their effectiveness and reduce their required board real estate. Carbon nanotubes (CNTs) have long been touted as a promising, electrically conductive, high aspect ratio material for use in electronics. However, their widespread use has been limited due to the harsh environments needed for their growth. This paper describes the application of an improved vertically aligned carbon nanotube (VACNT) transfer technique that circumvents this limitation. The process of transferring a carbon nanotube fence wall (CNTFW) on existing grounded via-fence structures via thermocompression bonding augments the EM isolation capability of the CNTFW using the metal coating used for the thermocompression bond, along with a post-process metal epoxy coating. The combination of augmentations possible on a transferred CNTFW structure enables an electromagnetic crosstalk isolation improvement of up to 16 dB in the frequency range from 0 to 50 GHz. The integration of such a technology allows for further downscaling of electromagnetic isolation solutions in electronic devices.
URI: https://hdl.handle.net/10356/177988
ISSN: 0008-6223
DOI: 10.1016/j.carbon.2024.118943
Schools: School of Electrical and Electronic Engineering 
Research Centres: IRL 3288 CINTRA (CNRS-NTU-THALES)
Rights: © 2024 Elsevier Ltd. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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