Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/178456
Title: Exploring opinion-unaware video quality assessment with semantic affinity criterion
Authors: Wu, Haoning
Liao, Liang
Hou, Jingwen
Chen, Chaofeng
Zhang, Erli
Wang, Annan
Sun, Wenxiu
Yan, Qiong
Lin, Weisi
Keywords: Computer and Information Science
Issue Date: 2023
Source: Wu, H., Liao, L., Hou, J., Chen, C., Zhang, E., Wang, A., Sun, W., Yan, Q. & Lin, W. (2023). Exploring opinion-unaware video quality assessment with semantic affinity criterion. 2023 IEEE International Conference on Multimedia and Expo (ICME), 366-371. https://dx.doi.org/10.1109/ICME55011.2023.00070
Conference: 2023 IEEE International Conference on Multimedia and Expo (ICME)
Abstract: Recent learning-based video quality assessment (VQA) algorithms are expensive to implement due to the cost of data collection of human quality opinions, and are less robust across various scenarios due to the biases of these opinions. This motivates our exploration on opinion-unaware (a.k.a zero-shot) VQA approaches. Existing approaches only considers low-level naturalness in spatial or temporal domain, without considering impacts from high-level semantics. In this work, we introduce an explicit semantic affinity index for opinion-unaware VQA using text-prompts in the contrastive language-image pre-training (CLIP) model. We also aggregate it with different traditional low-level naturalness indexes through gaussian normalization and sigmoid rescaling strategies. Composed of aggregated semantic and technical metrics, the proposed Blind Unified Opinion-Unaware Video Quality Index via Semantic and Technical Metric Aggregation (BUONA-VISTA) outperforms existing opinion-unaware VQA methods by at least 20% improvements, and is more robust than opinion-aware approaches.
URI: https://hdl.handle.net/10356/178456
ISBN: 9781665468916
DOI: 10.1109/ICME55011.2023.00070
Schools: College of Computing and Data Science 
School of Computer Science and Engineering 
Research Centres: S-Lab
Rights: © 2023 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:CCDS Conference Papers

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