Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/178995
Title: Salient sparse visual odometry with pose-only supervision
Authors: Chen, Siyu
Liu, Kangcheng
Wang, Chen
Yuan, Shenghai
Yang, Jianfei
Xie, Lihua
Keywords: Engineering
Issue Date: 2024
Source: Chen, S., Liu, K., Wang, C., Yuan, S., Yang, J. & Xie, L. (2024). Salient sparse visual odometry with pose-only supervision. IEEE Robotics and Automation Letters, 9(5), 4774-4781. https://dx.doi.org/10.1109/LRA.2024.3384757
Journal: IEEE Robotics and Automation Letters 
Abstract: Visual Odometry (VO) is vital for the navigation of autonomous systems, providing accurate position and orientation estimates at reasonable costs. While traditional VO methods excel in some conditions, they struggle with challenges like variable lighting and motion blur. Deep learning-based VO, though more adaptable, can face generalization problems in new environments. Addressing these drawbacks, this paper presents a novel hybrid visual odometry (VO) framework that leverages pose-only supervision, offering a balanced solution between robustness and the need for extensive labeling. We propose two cost-effective and innovative designs: a self-supervised homographic pre-training for enhancing optical flow learning from pose-only labels and a random patch-based salient point detection strategy for more accurate optical flow patch extraction. These designs eliminate the need for dense optical flow labels for training and significantly improve the generalization capability of the system in diverse and challenging environments. Our pose-only supervised method achieves competitive performance on standard datasets and greater robustness and generalization ability in extreme and unseen scenarios, even compared to dense optical flow-supervised state-of-the-art methods.
URI: https://hdl.handle.net/10356/178995
URL: http://arxiv.org/abs/2404.04677v1
ISSN: 2377-3766
DOI: 10.1109/LRA.2024.3384757
Schools: School of Electrical and Electronic Engineering 
Rights: © 2024 IEEE. All rights reserved. This article may be downloaded for personal use only. Any other use requires prior permission of the copyright holder. The Version of Record is available online at http://doi.org/10.1109/LRA.2024.3384757.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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