Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/179102
Title: Dynamically-biased fixed-point LSTM for time series processing in AIoT edge device
Authors: Hu, Jinhai
Goh, Wang Ling
Gao, Yuan
Keywords: Engineering
Issue Date: 2021
Source: Hu, J., Goh, W. L. & Gao, Y. (2021). Dynamically-biased fixed-point LSTM for time series processing in AIoT edge device. 2021 IEEE 3rd International Conference on Artificial Intelligence Circuits and Systems (AICAS). https://dx.doi.org/10.1109/AICAS51828.2021.9458508
Project: A18A1b0055 
Conference: 2021 IEEE 3rd International Conference on Artificial Intelligence Circuits and Systems (AICAS)
Abstract: In this paper, a Dynamically-Biased Long Short-Term Memory (DB-LSTM) neural network architecture is proposed for artificial intelligence internet of things (AIoT) applications. Different from the conventional LSTM which uses static bias, DB-LSTM adjusts the cell bias dynamically based on the previous status. Hence, a DB-LSTM cell contains information of both the previous output and the current cell state. With more information, the DB-LSTM is able to achieve faster training convergence and better accuracy. Furthermore, weight quantization is performed to reduce the weights to either 1-bit or 2-bit, so that the algorithm can be implemented in portable edge device. With the same 100 epochs training setup, more than 70% loss reduction are achieved for floating 32-bit, 1-bit and 2-bit weights, respectively. The loss degradation due to weight quantization is also negligible. The performance of the proposed model is also validated with the classical air passenger forecasting problem. 0.075 loss and 94.96% accuracy are achieved with 2-bit weight when compared to the ground truth, which is comparable to full-length 32-bit weight.
URI: https://hdl.handle.net/10356/179102
URL: https://ieeexplore.ieee.org/abstract/document/9458508
ISBN: 978-1-6654-1913-0
DOI: 10.1109/AICAS51828.2021.9458508
Schools: School of Electrical and Electronic Engineering 
Organisations: Institute of Microelectronics, A*STAR 
Rights: © 2021 IEEE. All rights reserved. This article may be downloaded for personal use only. Any other use requires prior permission of the copyright holder. The Version of Record is available online at http://doi.org/10.1109/AICAS51828.2021.9458508.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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