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https://hdl.handle.net/10356/180725
Title: | Few-layer Bi2O2Se: a promising candidate for high-performance near-room-temperature thermoelectric applications | Authors: | Yip, Weng Hou Fu, Qundong Wu, Jing Hippalgaonkar, Kedar Liu, Zheng Wang, Xingli Boutchich, Mohamed Tay, Beng Kang |
Keywords: | Engineering | Issue Date: | 2024 | Source: | Yip, W. H., Fu, Q., Wu, J., Hippalgaonkar, K., Liu, Z., Wang, X., Boutchich, M. & Tay, B. K. (2024). Few-layer Bi2O2Se: a promising candidate for high-performance near-room-temperature thermoelectric applications. Nanotechnology, 35(46), 465401-. https://dx.doi.org/10.1088/1361-6528/ad7035 | Project: | MOE-T2EP50221-0003 45272TB |
Journal: | Nanotechnology | Abstract: | Advancements in high-temperature thermoelectric (TE) materials have been substantial, yet identifying promising near-room-temperature candidates for efficient power generation from low-grade waste heat or TE cooling applications has become critical but proven exceedingly challenging. Bismuth oxyselenide (Bi2O2Se) emerges as an ideal candidate for near-room-temperature energy harvesting due to its low thermal conductivity, high carrier mobility and remarkable air-stability. In this study, the TE properties of few-layer Bi2O2Se over a wide temperature range (20-380 K) are investigated, where a charge transport mechanism transitioning from polar optical phonon to piezoelectric scattering at 140 K is observed. Moreover, the Seebeck coefficient (S) increases with temperature up to 280 K then stabilizes at∼-200μV K-1through 380 K. Bi2O2Se demonstrates high mobility (450 cm2V-1s-1) within the optimum power factor (PF) window, despite itsT-1.25dependence. The high mobility compensates the minor reduction in carrier densityn2Dhence contributes to maintain a robust electrical conductivity∼3 × 104S m-1. This results in a remarkable PF of 860μW m-1K-2at 280 K without the necessity for gating (Vg= 0 V), reflecting the innate performance of the as-grown material. These results underscore the considerable promise of Bi2O2Se for room temperature TE applications. | URI: | https://hdl.handle.net/10356/180725 | ISSN: | 0957-4484 | DOI: | 10.1088/1361-6528/ad7035 | Schools: | School of Electrical and Electronic Engineering School of Materials Science and Engineering |
Research Centres: | Centre for Micro- and Nano-Electronics IRL 3288 CINTRA, CNRS-International-NTU-THALES |
Rights: | © 2024 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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