Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/181018
Title: | Deblurring, artifact-free optical coherence tomography with deconvolution-random phase modulation | Authors: | Ge, Xin Chen, Si Lin, Kan Ni, Guangming Bo, En Wang, Lulu Liu, Linbo |
Keywords: | Engineering | Issue Date: | 2024 | Source: | Ge, X., Chen, S., Lin, K., Ni, G., Bo, E., Wang, L. & Liu, L. (2024). Deblurring, artifact-free optical coherence tomography with deconvolution-random phase modulation. Opto-Electronic Science, 3(1), 230020-230020. https://dx.doi.org/10.29026/oes.2024.230020 | Project: | RG35/22 MOE-T2EP30120-0001 203-A022001 |
Journal: | Opto-Electronic Science | Abstract: | Deconvolution is a commonly employed technique for enhancing image quality in optical imaging methods. Unfortunately, its application in optical coherence tomography (OCT) is often hindered by sensitivity to noise, which leads to additive ringing artifacts. These artifacts considerably degrade the quality of deconvolved images, thereby limiting its effectiveness in OCT imaging. In this study, we propose a framework that integrates numerical random phase masks into the deconvolution process, effectively eliminating these artifacts and enhancing image clarity. The optimized joint operation of an iterative Richardson-Lucy deconvolution and numerical synthesis of random phase masks (RPM), termed as Deconv-RPM, enables a 2.5-fold reduction in full width at half-maximum (FWHM). We demonstrate that the Deconv-RPM method significantly enhances image clarity, allowing for the discernment of previously unresolved cellular-level details in nonkeratinized epithelial cells ex vivo and moving blood cells in vivo. | URI: | https://hdl.handle.net/10356/181018 | ISSN: | 2097-0382 | DOI: | 10.29026/oes.2024.230020 | Schools: | School of Electrical and Electronic Engineering School of Chemical and Biomedical Engineering |
Rights: | © The Author(s) 2024. Published by Institute of Optics and Electronics, Chinese Academy of Sciences.This article is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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oes-2023-0020.pdf | 5.68 MB | Adobe PDF | ![]() View/Open |
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