Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/181018
Title: Deblurring, artifact-free optical coherence tomography with deconvolution-random phase modulation
Authors: Ge, Xin
Chen, Si
Lin, Kan
Ni, Guangming
Bo, En
Wang, Lulu
Liu, Linbo
Keywords: Engineering
Issue Date: 2024
Source: Ge, X., Chen, S., Lin, K., Ni, G., Bo, E., Wang, L. & Liu, L. (2024). Deblurring, artifact-free optical coherence tomography with deconvolution-random phase modulation. Opto-Electronic Science, 3(1), 230020-230020. https://dx.doi.org/10.29026/oes.2024.230020
Project: RG35/22 
MOE-T2EP30120-0001 
203-A022001 
Journal: Opto-Electronic Science 
Abstract: Deconvolution is a commonly employed technique for enhancing image quality in optical imaging methods. Unfortunately, its application in optical coherence tomography (OCT) is often hindered by sensitivity to noise, which leads to additive ringing artifacts. These artifacts considerably degrade the quality of deconvolved images, thereby limiting its effectiveness in OCT imaging. In this study, we propose a framework that integrates numerical random phase masks into the deconvolution process, effectively eliminating these artifacts and enhancing image clarity. The optimized joint operation of an iterative Richardson-Lucy deconvolution and numerical synthesis of random phase masks (RPM), termed as Deconv-RPM, enables a 2.5-fold reduction in full width at half-maximum (FWHM). We demonstrate that the Deconv-RPM method significantly enhances image clarity, allowing for the discernment of previously unresolved cellular-level details in nonkeratinized epithelial cells ex vivo and moving blood cells in vivo.
URI: https://hdl.handle.net/10356/181018
ISSN: 2097-0382
DOI: 10.29026/oes.2024.230020
Schools: School of Electrical and Electronic Engineering 
School of Chemical and Biomedical Engineering 
Rights: © The Author(s) 2024. Published by Institute of Optics and Electronics, Chinese Academy of Sciences.This article is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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