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https://hdl.handle.net/10356/181255
Title: | Transverse recoil imprinted on free-electron radiation | Authors: | Shi, Xihang Wong, Wesley Lee Wei Huang, Sunchao Wong, Liang Jie Kaminer, Ido |
Keywords: | Engineering | Issue Date: | 2024 | Source: | Shi, X., Wong, W. L. W., Huang, S., Wong, L. J. & Kaminer, I. (2024). Transverse recoil imprinted on free-electron radiation. Nature Communications, 15(1), 7803-. https://dx.doi.org/10.1038/s41467-024-52050-w | Project: | NRF2020-NRFISF004-3525 NAP SUG |
Journal: | Nature Communications | Abstract: | Phenomena of free-electron X-ray radiation are treated almost exclusively with classical electrodynamics, despite the intrinsic interaction being that of quantum electrodynamics. The lack of quantumness arises from the vast disparity between the electron energy and the much smaller photon energy, resulting in a small cross-section that makes quantum effects negligible. Here we identify a fundamentally distinct phenomenon of electron radiation that bypasses this energy disparity, and thus displays extremely strong quantum features. This phenomenon arises when free-electron transverse scattering occurs during the radiation process, creating entanglement between each transversely recoiled electron and the photons it emitted. This phenomenon profoundly modifies the characteristics of free-electron radiation mediated by crystals, compared to conventional classical analysis and even previous quantum analysis. We also analyze conditions to detect this phenomenon using low-emittance electron beams and high-resolution X-ray spectrometers. These quantum radiation features could guide the development of compact coherent X-ray sources facilitated by nanophotonics and quantum optics. | URI: | https://hdl.handle.net/10356/181255 | ISSN: | 2041-1723 | DOI: | 10.1038/s41467-024-52050-w | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2024 The Author(s). Open Access. This article is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License, which permits any non-commercial use, sharing, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if you modified the licensed material. You do not have permission under this licence to share adapted material derived from this article or parts of it. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http:// creativecommons.org/licenses/by-nc-nd/4.0/. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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s41467-024-52050-w.pdf | 2.42 MB | Adobe PDF | ![]() View/Open |
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